Modeling of carbon nanotube-metal contact losses in electronic devices

Abstract

In this paper, we introduce an efficient approach to estimate the losses of carbon nanotube-based devices. The approach is based on realistic operational parameters beyond quantum limits. It calculates the electric resistance and conductance for different devices with different numbers of carbon nanotubes. The model shows good agreement with experimental data. An efficient approach to estimate the number of nanotubes per device has also been developed. The model can be easily implemented in commercial simulators.