The effect of photonic processing on increasing the thermoelectric Q-factor of a solid solution Bi2Te3 – Bi2Se3

Е. K. Belonogov, S. Kuschev, М. P. Sumets, D. Serikov, А. А. Grebennikov, V. Dybov, А. Kostyuchenko, Т. L. Turaeva
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Abstract

In the present work, the phase compositions, morphology, structure, and thermal conductivity of Bi2Te3 – хSeх-based semiconductor wafers before and after the photon treatment (PT) were investigated by X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and laser flash methods. The semiconductor plates 10 × 10 × 2 mm in size were prepared by electric discharge cutting from the briquettes, synthesized by hot pressing of Bi2Te3 – хSeх powder. Then, the plates were annealed at 570 K in an argon atmosphere for 24 h. The PT was carried out in an Ar atmosphere by irradiation of gas-discharge xenon lamps with pulses of 1.0 and 1.4 s and energy density ranging from 125 to 175 J/cm2. As revealed, the PT initiates the formation of a thin surface layer with an inhomogeneous nanocrystalline structure and an arbitrary nanocrystals orientation. The volume of material manifests a large-block textured crystalline structure with the original elemental and phase compositions formed during the extrusion. Thereby, a gradient nanostructured region composed of nano-sized and large Bi2Te3 – хSeх crystals with tunneling contacts is formed in the process of PT. We revealed that the PT changes the material bandgap slightly, decreases the concentration of charge carriers, increasing their mobility. The scattering of carriers and photons on linear defects dominates in a wide temperature range in the studied samples. Thereby, the figure of merit rise s by 8 % after PT, due to a decrease in the phonon component of thermal conductivity.
光子处理对提高Bi2Te3 - Bi2Se3固溶体热电q因子的影响
本文采用x射线衍射、扫描电镜、透射电镜和激光闪蒸等方法研究了光子处理前后Bi2Te3 - хSeх-based半导体晶圆的相组成、形貌、结构和热导率。以Bi2Te3 - хSeх粉末热压合成的型煤为原料,采用电火花切割法制备了尺寸为10 × 10 × 2 mm的半导体板。然后,在570 K的氩气气氛中退火24 h。在氩气气氛中,通过脉冲为1.0和1.4 s、能量密度为125 ~ 175 J/cm2的气体放电氙灯照射进行PT。结果表明,PT引发了具有不均匀纳米晶结构和任意纳米晶取向的薄表面层的形成。材料体积表现为大块织构晶体结构,具有挤压过程中形成的原始元素和相组成。因此,在PT过程中形成了一个由具有隧道接触的纳米级大Bi2Te3 - хSeх晶体组成的梯度纳米结构区域。我们发现,PT略微改变了材料的带隙,降低了载流子的浓度,提高了它们的迁移率。在所研究的样品中,载流子和光子在线性缺陷上的散射在较宽的温度范围内占主导地位。因此,由于热导率的声子成分减少,PT后的性能值上升了8%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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