Study on the optimal distribution of redundancy effort in cross-layer reliable architectures

N. Aymerich, A. Rubio
{"title":"Study on the optimal distribution of redundancy effort in cross-layer reliable architectures","authors":"N. Aymerich, A. Rubio","doi":"10.1109/NANO.2013.6720848","DOIUrl":null,"url":null,"abstract":"This paper presents a comprehensive approach to the smart application of redundancy techniques in multiple-layer hierarchical systems. Computing systems today are rapidly evolving into increasingly complex structures with an ever-increasing number of components. Moreover, future technology generations are expected to have associated lower levels of quality. For these reasons, it is emerging nowadays a renewed interest in the development of reliable architectures. In this work we delve into this topic putting special emphasis on the system hardware hierarchy. We analyze the advantages in terms of reliability of distributing redundancy effort in cross-layer systems. We base our analysis on a general fault model that takes into account both devices and interconnections. Using the Rent's Law we relate the number of devices and interconnections for different configurations of redundancy and compare the global error probability. Our results provide meaningful information about the benefits that can be achieved by properly choosing the system layer at which to apply redundancy, and if applicable, the optimal distribution of redundancy effort through the system layers.","PeriodicalId":189707,"journal":{"name":"2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2013.6720848","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper presents a comprehensive approach to the smart application of redundancy techniques in multiple-layer hierarchical systems. Computing systems today are rapidly evolving into increasingly complex structures with an ever-increasing number of components. Moreover, future technology generations are expected to have associated lower levels of quality. For these reasons, it is emerging nowadays a renewed interest in the development of reliable architectures. In this work we delve into this topic putting special emphasis on the system hardware hierarchy. We analyze the advantages in terms of reliability of distributing redundancy effort in cross-layer systems. We base our analysis on a general fault model that takes into account both devices and interconnections. Using the Rent's Law we relate the number of devices and interconnections for different configurations of redundancy and compare the global error probability. Our results provide meaningful information about the benefits that can be achieved by properly choosing the system layer at which to apply redundancy, and if applicable, the optimal distribution of redundancy effort through the system layers.
跨层可靠体系结构中冗余力的最优分配研究
本文提出了一种在多层分层系统中智能应用冗余技术的综合方法。当今的计算系统正迅速演变为具有不断增加的组件数量的日益复杂的结构。此外,预计未来几代技术将具有较低的质量水平。由于这些原因,现在人们对开发可靠的体系结构重新产生了兴趣。在这项工作中,我们深入研究了这个主题,特别强调了系统硬件层次结构。从可靠性的角度分析了分布式冗余在跨层系统中的优势。我们的分析基于一个通用的故障模型,该模型同时考虑了设备和互连。利用Rent’s Law将不同冗余配置下的设备和互连数量联系起来,并比较全局错误概率。我们的结果提供了有意义的信息,说明通过正确选择应用冗余的系统层,以及在适当的情况下,通过系统层实现冗余工作的最佳分布,可以获得哪些好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信