Manufacturing Cost Simulations for Low Cost RFID

G. Swamy
{"title":"Manufacturing Cost Simulations for Low Cost RFID","authors":"G. Swamy","doi":"10.2139/ssrn.3690073","DOIUrl":null,"url":null,"abstract":"In a previous Auto-ID publication, “Towards a 5¢ Tag”, we speculated on manufacturing and system methods to approach the elusive goal of a 5¢ Radio Frequency Identification (or RFID) tag. We extend our cost analysis in this paper and simulate manufacturing and assembly processes to examine the feasibility of the 5¢ tag. We do so assuming that large volumes are being manufactured achieving which is, of course, another challenge entirely. We experiment with variations in process, throughput and component variables to estimate what will be required to approach the 5¢ goal. As part of this experiment, we examine both the semiconductor manufacturing and the assembly of RFID tags. Our approach consists of two steps: bench-marking the processes employed and the equipment used, and 2) cost model simulation using this benchmark data. Our simulation models are inspired on earlier work on semiconductor costing at SEMATECH and at the University of California at Berkeley.","PeriodicalId":364869,"journal":{"name":"ERN: Simulation Methods (Topic)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ERN: Simulation Methods (Topic)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.3690073","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In a previous Auto-ID publication, “Towards a 5¢ Tag”, we speculated on manufacturing and system methods to approach the elusive goal of a 5¢ Radio Frequency Identification (or RFID) tag. We extend our cost analysis in this paper and simulate manufacturing and assembly processes to examine the feasibility of the 5¢ tag. We do so assuming that large volumes are being manufactured achieving which is, of course, another challenge entirely. We experiment with variations in process, throughput and component variables to estimate what will be required to approach the 5¢ goal. As part of this experiment, we examine both the semiconductor manufacturing and the assembly of RFID tags. Our approach consists of two steps: bench-marking the processes employed and the equipment used, and 2) cost model simulation using this benchmark data. Our simulation models are inspired on earlier work on semiconductor costing at SEMATECH and at the University of California at Berkeley.
低成本RFID制造成本模拟
在之前的自动识别出版物“走向5美分标签”中,我们对制造和系统方法进行了推测,以接近5美分射频识别(或RFID)标签的难以捉摸的目标。我们在本文中扩展了我们的成本分析,并模拟制造和组装过程来检验5美分标签的可行性。我们这样做的前提是大量生产,当然,这完全是另一个挑战。我们对过程、吞吐量和组件变量的变化进行实验,以估计接近5美分目标所需的条件。作为本实验的一部分,我们将研究RFID标签的半导体制造和组装。我们的方法包括两个步骤:对所采用的流程和使用的设备进行基准测试,以及2)使用该基准数据进行成本模型模拟。我们的模拟模型受到SEMATECH和加州大学伯克利分校早期半导体成本工作的启发。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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