Improving Accuracy and Performance Through Automatic Model Generation for Gate-Level Circuit PDES with Reverse Computation

Elsa Gonsiorowski, Justin M. LaPre, C. Carothers
{"title":"Improving Accuracy and Performance Through Automatic Model Generation for Gate-Level Circuit PDES with Reverse Computation","authors":"Elsa Gonsiorowski, Justin M. LaPre, C. Carothers","doi":"10.1145/2769458.2769463","DOIUrl":null,"url":null,"abstract":"Gate-level circuit simulation is an important step in the design and validation of complex circuits. This step of the process relies on existing libraries for gate specifications. We start with a generic gate model for Rensselaer's Optimistic Simulation System (ROSS), a parallel discrete-event simulation framework. This generic model encompasses all functionality needed by optimistic simulation using reverse computation. We then describe a parser system which uses a standardized gate library to create a specific model for simulation. The generated model is comprised of several function including those needed for an accurate model of timing behavior. To quantify the improvements that an automatically generated model can have over a hand written model we compare two gate library models: an automatically generated LSI-10K library model and a previously investigated, handwritten, simplified GTECH library model. We conclude that the automatically generated model is a more accurate model of actual hardware. The generated model also represents the timing behavior with an approximately 50 times higher degree of fidelity. In comparison to previous results, we find that the automatically generated model is able to achieve better optimistic simulation performance when measured against conservative simulation. We identify peak optimistic performance when using 128 MPI-Ranks on eight nodes of an IBM Blue Gene/Q machine.","PeriodicalId":138284,"journal":{"name":"Proceedings of the 3rd ACM SIGSIM Conference on Principles of Advanced Discrete Simulation","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd ACM SIGSIM Conference on Principles of Advanced Discrete Simulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2769458.2769463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Gate-level circuit simulation is an important step in the design and validation of complex circuits. This step of the process relies on existing libraries for gate specifications. We start with a generic gate model for Rensselaer's Optimistic Simulation System (ROSS), a parallel discrete-event simulation framework. This generic model encompasses all functionality needed by optimistic simulation using reverse computation. We then describe a parser system which uses a standardized gate library to create a specific model for simulation. The generated model is comprised of several function including those needed for an accurate model of timing behavior. To quantify the improvements that an automatically generated model can have over a hand written model we compare two gate library models: an automatically generated LSI-10K library model and a previously investigated, handwritten, simplified GTECH library model. We conclude that the automatically generated model is a more accurate model of actual hardware. The generated model also represents the timing behavior with an approximately 50 times higher degree of fidelity. In comparison to previous results, we find that the automatically generated model is able to achieve better optimistic simulation performance when measured against conservative simulation. We identify peak optimistic performance when using 128 MPI-Ranks on eight nodes of an IBM Blue Gene/Q machine.
采用反向计算的门级电路PDES自动模型生成方法提高精度和性能
门级电路仿真是复杂电路设计和验证的重要步骤。流程的这一步依赖于门规范的现有库。我们从Rensselaer乐观仿真系统(ROSS)的通用门模型开始,ROSS是一个并行离散事件仿真框架。这个通用模型包含了使用反向计算的乐观模拟所需的所有功能。然后,我们描述了一个解析器系统,该系统使用标准化的门库来创建特定的模型进行仿真。生成的模型由几个函数组成,其中包括精确的定时行为模型所需的函数。为了量化自动生成模型相对于手写模型的改进,我们比较了两种栅极库模型:自动生成的LSI-10K库模型和先前研究过的、手写的、简化的GTECH库模型。我们得出结论,自动生成的模型是一个更准确的实际硬件模型。生成的模型还以大约50倍高的保真度表示时序行为。与之前的结果相比,我们发现自动生成的模型在与保守模拟进行比较时能够获得更好的乐观模拟性能。当在IBM Blue Gene/Q机器的8个节点上使用128 mpi - rank时,我们确定了峰值乐观性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信