{"title":"COMPARATIVE ANALYSIS OF METHODS FOR CALCULATING MUTUAL CORRELATION IN PROCESSING OF PHOTOLUMINISCENCE IMAGES OF MULTICRYSTALLINE SILICON WAFERS","authors":"A. E. Serebryakov, O. Belyakov","doi":"10.21667/1995-4565-2019-69-221-226","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":143198,"journal":{"name":"Vestnik of Ryazan State Radio Engineering University","volume":"283 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Vestnik of Ryazan State Radio Engineering University","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21667/1995-4565-2019-69-221-226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}