{"title":"On the switching performance of semiconductor devices in a cascode switch","authors":"T. Chan, M. Morcos","doi":"10.1109/IAS.1996.559269","DOIUrl":null,"url":null,"abstract":"The gate turn-off (GTO) thyristor has the highest voltage and current rating among the semiconductor power switches used extensively today. The insulated-gate bipolar transistor (IGBT) is used to improve switching performance of a GTO in a cascode switch. This paper documents the switching performance of the different power semiconductor devices used in an IGBT-gated GTO-cascode switch. The cascode switch was tested and simulated using SPICE. Experimental waveforms are presented and show good agreement with simulation results.","PeriodicalId":177291,"journal":{"name":"IAS '96. Conference Record of the 1996 IEEE Industry Applications Conference Thirty-First IAS Annual Meeting","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IAS '96. Conference Record of the 1996 IEEE Industry Applications Conference Thirty-First IAS Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.1996.559269","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The gate turn-off (GTO) thyristor has the highest voltage and current rating among the semiconductor power switches used extensively today. The insulated-gate bipolar transistor (IGBT) is used to improve switching performance of a GTO in a cascode switch. This paper documents the switching performance of the different power semiconductor devices used in an IGBT-gated GTO-cascode switch. The cascode switch was tested and simulated using SPICE. Experimental waveforms are presented and show good agreement with simulation results.