Development and Applications of a Fiber-Coupled Atom-Based Electric Field Probe

Abstract

We are developing a fundamentally new atom-based approach for electric (E) field measurements. This new approach will lead to a self-calibrated, SI traceable, E-field measurement, providing us with the capability to perform measurements on a fine spatial resolution in both the far- and near-fields. Here, we discuss the development and applications of the first moveable fiber-coupled version of this atom-based E-field measurement approach. We show results for various measurements including: far-field measurements of the E-fields, measurements of the E-field distribution along the surface of a circuit board, field measurements in apertures, measurements of the directivity pattern of a horn antenna, and measurements made in a GTEM cell.