{"title":"The w-Plane as a Graphical Representation of Sampler Configuration in a Sampled-Network Reflectometer","authors":"D. Donahue, T. Barton","doi":"10.1109/arftg54656.2022.9896574","DOIUrl":null,"url":null,"abstract":"This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance sensing approach leverages a six- to four-port reduction technique that produces a graphical representation known as the w-plane. In this work, an experimental setup in which the samplers can be located near-arbitrarily within the network is used to explore the w-plane’s characteristics and relationship to the physical reflectometer.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/arftg54656.2022.9896574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance sensing approach leverages a six- to four-port reduction technique that produces a graphical representation known as the w-plane. In this work, an experimental setup in which the samplers can be located near-arbitrarily within the network is used to explore the w-plane’s characteristics and relationship to the physical reflectometer.