Conductive Adhesives containing Ag-Sn Alloys as Conductive Filler

G. Toida, Y. Shirai, N. Mizmura, M. Komagata, K. Suzuki
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引用次数: 4

Abstract

Ag filled isotropic conductive adhesives (ICA) have been investigated as promising altenatives for lead containing solders in surface mount technology (SMT) applications; however, one serious concern is the ionic-migration of the silver filled in the ICA, especially when used in high density interconnection assemblies. In his study, ionic-migration resistance and the contact resistance of the ICA containing Ag-Sn alloy conductive fillers were evaluated. It was found that ionic-migration resistance depended on the Ag-Sn ratio and that Ag-Sn alloys containing 25 to 75 mol% of Sn had excellent ionic-migration resistance though their contact resistance was rather high, compared with silver. For the compatibility of the ionic-migration resistance with lower contact resistance, and to understand the effect of a Sn-Bi alloy powder mixture, several additives and polymer matrixes were also studied. New ICAs including these additives and a conventional ICA (as reference) were evaluated for SMT. Chip components with Sn plated terminations for stability in both contact resistance and adhesion strength were monitored during reliability tests. From the test results, it can be concluded that the new ICA is a potential material for SMT applications. Moreover, if mount loading was not sufficient and/or mount alignment was not suitable, initial contact resistance was unstable. Therefore, we selected materials with reduction effect and we dereased the Sn ratio as low as we could. The filler content rate was also increased. As a result the loading dependence was decreased. We were sucessful in keeping contact resistance more stable while maintaining good ionic-migration resistance.
含银锡合金导电填料的导电胶粘剂
Ag填充的各向同性导电胶粘剂(ICA)已被研究为表面贴装技术(SMT)应用中含铅焊料的有前途的替代品;然而,一个严重的问题是填充在ICA中的银的离子迁移,特别是在高密度互连组件中使用时。在他的研究中,对含有银锡合金导电填料的ICA的离子迁移电阻和接触电阻进行了评估。结果表明,Ag-Sn合金的离子迁移性能与银锡比有关,锡含量为25 ~ 75 mol%的Ag-Sn合金虽然接触电阻高于银合金,但具有良好的离子迁移性能。为了研究离子迁移电阻与低接触电阻的相容性,并了解Sn-Bi合金粉末混合物的影响,还研究了几种添加剂和聚合物基质。对含有这些添加剂的新型ICA和常规ICA(作为参考)进行了SMT评价。在可靠性测试中,对镀锡端子的芯片组件的接触电阻和粘附强度进行了监测。从测试结果可以得出结论,新型ICA是一种潜在的SMT应用材料。此外,如果安装负载不够和/或安装对准不合适,初始接触电阻是不稳定的。因此,我们选择了具有还原效果的材料,并尽可能降低Sn比。填料含量也有所提高。结果表明,载荷依赖性降低。我们成功地保持了更稳定的接触电阻,同时保持了良好的离子迁移阻力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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