Disruption and damage of an electrooptic modulator by pulsed microwaves

R. Schermer, F. Bucholtz, C. Villarruel, J. G. Gil, T. Andreadis, K. Williams
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Abstract

These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.
脉冲微波对电光调制器的破坏
这些结果证明了商用LiNbO3 EO调制器能够承受高达200w的直接脉冲RF输入的损坏。然而,短期中断发生在几瓦,这表明需要改进调制器的热设计。
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