Fault tolerant analysis of associative memories

Abstract

The performance of fault tolerant associative memories is investigated. Instead of presenting the results by simulation, the authors mathematically show that the one-step retrieval probability in most cases decreases with the increase in error ratio, number of error bits, and number of stored patterns. For the case of faulty resistance, however, the performance will surpass the nonerror situation under the positive weight change. This is not only true in the Hopfield interconnection topology but is also true in the exponential correlation case.<>