Insulator damages related to charge detrapping

C. Le Gressus, G. Blaise
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引用次数: 4

Abstract

It is shown that a critical space charge variation is the cause of insulator sample damage ranging from atom size to macroscopic size. This finding has implications for space charge characterization. Correlation of the space charge characteristics to breakdown strength requires the critical conditions for initiating breakdown. These conditions are related to such material intrinsic parameters as the trap energy distribution, the trap spatial distribution, the schubweg, and the modification of the free energy of the charged sample. The crucial point is therefore not how to measure the charge distribution but how to characterize trapping/detrapping critical parameters.<>
绝缘子损坏与电荷脱除有关
结果表明,临界空间电荷变化是导致绝缘子样品从原子尺寸到宏观尺寸损伤的原因。这一发现对空间电荷表征具有启示意义。空间电荷特性与击穿强度的相关性需要初始击穿的临界条件。这些条件与俘获能分布、俘获空间分布、束重和带电样品的自由能修正等材料的本征参数有关。因此,关键不在于如何测量电荷分布,而在于如何表征捕获/去捕获的关键参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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