{"title":"A CMOS Image Sensor for DNA Microarrays","authors":"S. Parikh, Glenn Gulak, P. Chow","doi":"10.1109/CICC.2007.4405854","DOIUrl":null,"url":null,"abstract":"An image sensor designed with standard 0.18 mum CMOS technology is used to construct a DNA microarray scanner. The detection limit of 4590 fluorophores/mum2 is compared with 4.49 fluorophores/mum2 of a commercial photomultiplier-tube-based microarray scanner. The performance gap can be reduced by improving optical coupling, mechanical alignment, laser power supply noise, improved circuit noise and an increase in the conversion gain. The CMOS sensor offers multiple-pixels for reduced scan time and an integrated analog-to-digital converter.","PeriodicalId":130106,"journal":{"name":"2007 IEEE Custom Integrated Circuits Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2007.4405854","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
An image sensor designed with standard 0.18 mum CMOS technology is used to construct a DNA microarray scanner. The detection limit of 4590 fluorophores/mum2 is compared with 4.49 fluorophores/mum2 of a commercial photomultiplier-tube-based microarray scanner. The performance gap can be reduced by improving optical coupling, mechanical alignment, laser power supply noise, improved circuit noise and an increase in the conversion gain. The CMOS sensor offers multiple-pixels for reduced scan time and an integrated analog-to-digital converter.
采用标准的0.18 μ m CMOS技术设计图像传感器,构建DNA微阵列扫描仪。将4590个荧光团/mum2的检测限与商用光电倍增管微阵列扫描仪的4.49个荧光团/mum2进行了比较。性能差距可以通过改善光耦合、机械对准、激光电源噪声、改善电路噪声和增加转换增益来减小。CMOS传感器提供多像素,以减少扫描时间和集成的模数转换器。