Statistical Process Control in Fused Deposition Modeling based on Tanimoto similarity of uniform surface images of product

Abstract

this paper proposed a method to monitor the quality of Fused Deposition Modeling (FDM) products using Statistical Process Control (SPC) based on profile data. Profile data is extracted from product surface image of each layer. Tanimoto similarity between the current profile data and the ideal one is calculated, then used to monitor the manufacturing process. Simulation study is presented to show the property of this method. Case study is given finally as an application in FDM. The proposed method has significant potential for application in real-time monitoring.