A high power handling capability CMOS T/R switch for X-band phased array antenna systems

T. Dinc, S. Zihir, Ferhat Taşdemir, Y. Gurbuz
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引用次数: 11

Abstract

This paper presents a single-pole double-throw (SPDT) transmit/receive (T/R) switch fabricated in 0.25-μm SiGe BiCMOS process for X-Band (8–12 GHz) phased array radar applications. The switch is based on series-shunt topology with combination of techniques to improve insertion loss (IL), isolation and power handling capability (P1dB). These techniques include optimization of transistor widths for lower insertion loss and parallel resonance technique to improve isolation. In addition, DC biasing of input and output ports, on-chip impedance transformation networks (ITN) and resistive body-floating are used to improve P1dB of the switch. All these design techniques resulted in a measured IL of 3.6 dB, isolation of 30.8 dB and P1dB of 28.2 dBm at 10 GHz. The return losses at both input and output ports are better than 16 dB from 8 to 12 GHz. To our knowledge, this work presents the highest P1dB at X-Band compared to other reported single-ended CMOS T/R switches in the literature.
用于x波段相控阵天线系统的高功率处理能力CMOS T/R开关
提出了一种用于x波段(8-12 GHz)相控阵雷达的单极双掷(SPDT)收发(T/R)开关,该开关采用0.25-μm SiGe BiCMOS工艺制造。该开关基于串联并联拓扑结构,结合多种技术,可提高插入损耗(IL)、隔离和功率处理能力(P1dB)。这些技术包括优化晶体管宽度以降低插入损耗和并行谐振技术以提高隔离。此外,采用输入输出端直流偏置、片上阻抗变换网络(ITN)和电阻体浮等方法提高开关的P1dB。所有这些设计技术的结果是,在10 GHz时测量到的IL为3.6 dB,隔离度为30.8 dB, P1dB为28.2 dBm。在8 ~ 12 GHz范围内,输入、输出端回波损耗均小于16db。据我们所知,与文献中报道的其他单端CMOS T/R开关相比,这项工作在x波段呈现出最高的P1dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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