Scatterometry of isolated resist pattern by soft X-rays using deep-learning analysis

T. Hoshino, S. Aoki, Masahide Itoh, M. Shichiri, Hiroshi Itoh
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Abstract

When the scattering or absorption is large, the 3D resolution is about 100 wavelengths in holography, but the combination of scatterometry, imaging, and deep learning is a general-purpose method with a resolution of about wavelength.
使用深度学习分析的软x射线对隔离抗蚀图案的散射测量
当散射或吸收较大时,全息术的3D分辨率约为100波长,而散射测量、成像和深度学习相结合是一种通用的方法,分辨率约为波长。
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