Validation Technique for Thin Oxide CDM Protections

Abstract

This paper describes a validation technique that permits the evaluation of the Charge Device Model Electrostatic Discharge (CDM-ESD) in case of long metal interconnection between driver-receiver pair. The problem statement and verification approach are illustrated. A fully defined method that will help the prevention of the CDM-ESD event, with emphasis on future steps to detect the failures for 28nm technology thin-oxide devices is reported.