Diagnosis of digital/analogue measurement system with application of test bus and distributed diagnostic subsystem

K. Badzmirowski, M. Gonera, J. Kern
{"title":"Diagnosis of digital/analogue measurement system with application of test bus and distributed diagnostic subsystem","authors":"K. Badzmirowski, M. Gonera, J. Kern","doi":"10.1109/IMTC.1998.679834","DOIUrl":null,"url":null,"abstract":"The article describes a method of diagnosis applied to the digital/analogue distributed measurement systems, based on a diagnostic subsystem with the distributed multilayer structure of hardware and software. The solution described, enables one to join independence of the diagnostic subsystem and possibility of using the diagnosed distributed measurement system resources, both of the equipment (JTAG diagnostic bus) and of the software (e.g. standard software modules working in the WINDOWS environment). To find limitations of IEEE 1149 Test Bus standard for parametric faults monitoring, we measured and presented some characteristics of the Programmable Acquisition Modules, including P1149.4 test chip. The developed Diagnostic Subsystem described herein, thanks to the flexible structure and universality of modules, interfaces and programming software, enables development of the additional virtual aids, adapted to needs of the particular applications.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1998.679834","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The article describes a method of diagnosis applied to the digital/analogue distributed measurement systems, based on a diagnostic subsystem with the distributed multilayer structure of hardware and software. The solution described, enables one to join independence of the diagnostic subsystem and possibility of using the diagnosed distributed measurement system resources, both of the equipment (JTAG diagnostic bus) and of the software (e.g. standard software modules working in the WINDOWS environment). To find limitations of IEEE 1149 Test Bus standard for parametric faults monitoring, we measured and presented some characteristics of the Programmable Acquisition Modules, including P1149.4 test chip. The developed Diagnostic Subsystem described herein, thanks to the flexible structure and universality of modules, interfaces and programming software, enables development of the additional virtual aids, adapted to needs of the particular applications.
测试总线和分布式诊断子系统在数模测量系统诊断中的应用
本文介绍了一种基于软硬件分布式多层结构的诊断子系统的数字/模拟分布式测量系统的诊断方法。所描述的解决方案使人们能够加入诊断子系统的独立性和使用诊断分布式测量系统资源的可能性,包括设备(JTAG诊断总线)和软件(例如在WINDOWS环境下工作的标准软件模块)。为了找出IEEE 1149测试总线标准在参数化故障监测方面的局限性,对P1149.4测试芯片等可编程采集模块的一些特性进行了测量和介绍。本文所开发的诊断子系统,由于其模块、接口和编程软件的结构灵活、通用性强,可以开发附加的虚拟辅助工具,以适应特定应用的需要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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