Retrieving the reflection coefficient of a sample from the frequency response of a special open resonator

Y. Choni, A. G. Romanov, V. Lavrushev
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Abstract

This paper focuses on accurate measuring the electromagnetic reflection at K band from flat samples made of a composite material or a metal mesh. A special open resonator comprising a sample under test features a good sensitivity due to multiple reflections in the cavity and absence of any contact between the sample and the installation. Data processing algorithm arises from geometric optics description of the microwave field in the resonator. Digital modeling with the CST Microwave Studio software and real experiments with use of ZVA50 signal analyzer confirmed efficiency of the proposed technique.
从特殊开式谐振器的频率响应中提取样品的反射系数
本文重点研究了用复合材料或金属网制作的平面样品精确测量K波段电磁反射。由待测样品组成的特殊开式谐振器由于腔内的多次反射而具有良好的灵敏度,并且样品与装置之间没有任何接触。数据处理算法来源于谐振腔内微波场的几何光学描述。利用CST Microwave Studio软件进行了数字建模,并利用ZVA50信号分析仪进行了实际实验,验证了该技术的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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