Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Pub Date : 1900-01-01 DOI:10.1109/DDECS57882.2023.10139525

L. Bolzani

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Abstract

The use of Resistive Random Access Memories (RRAMs) for implementing emerging applications depends not only on being able to properly test them after manufacturing, but also being able to guarantee their reliability during lifetime. These novel non-volatile memories can be affected by manufacturing deviations, process variation and defects, as well as by time-dependent deviations, environmental and temporal variations. In this context, this tutorial aims to introduce the main sources of reliability issues at time zero and during lifetime, high-lighting the challenges related to properly identify manufacturing failure mechanisms and consequently, the deviation of more ac-curate fault models. In addition, this tutorial aims to summarize the state-of-the-art regarding manufacturing test strategies and provide a discussion about the key challenges of testing RRAMs at time zero. Finally, this tutorial provides information about how to increase the efficiency of manufacturing test strategies in order to avoid test escapes, which can compromise RRAM’s reliability during lifetime.

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嵌入式教程- rram:如何保证其制造后的质量测试?

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IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

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