{"title":"ESD Protection Design Overview in Advanced SOI and Bulk FinFET Technologies","authors":"You Li, M. Miao, R. Gauthier","doi":"10.1109/CICC48029.2020.9075904","DOIUrl":null,"url":null,"abstract":"The FinFET era brings new challenges to ESD protection. An overview of ESD design in advanced SOI and bulk FinFET technologies are presented. The design innovations and device optimizations are explored to achieve an effective ESD protection. The predictive ESD modeling and simulations are studied to optimize ESD protection and ensure first-time-right chip ESD design in FinFET technologies.","PeriodicalId":409525,"journal":{"name":"2020 IEEE Custom Integrated Circuits Conference (CICC)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC48029.2020.9075904","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The FinFET era brings new challenges to ESD protection. An overview of ESD design in advanced SOI and bulk FinFET technologies are presented. The design innovations and device optimizations are explored to achieve an effective ESD protection. The predictive ESD modeling and simulations are studied to optimize ESD protection and ensure first-time-right chip ESD design in FinFET technologies.