{"title":"An Intelligent Vision System for Inspection of SMDS","authors":"E. K. Teoh, D. Mital, B. lee, L. K. Wee","doi":"10.1109/ETFA.1992.683322","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":154369,"journal":{"name":"IEEE International Workshop on Emerging Technologies and Factory Automation,","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Workshop on Emerging Technologies and Factory Automation,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETFA.1992.683322","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}