{"title":"A Simple Panel Unit-Root Test with Smooth Breaks in the Presence of a Multifactor Error Structure","authors":"Chingnun Lee, Jyh‐Lin Wu, Lixong Yang","doi":"10.2139/ssrn.2327962","DOIUrl":null,"url":null,"abstract":"This paper proposes a new simple panel unit-root test by extending the cross-sectionally augmented panel unit-root test (CIPS) developed by Pesaran et al. (2013) to allow for smoothing structural changes in deterministic terms, approximated by a Fourier series. The proposed statistic is the simple average of the individual statistics constructed from the breaks and cross-sectional dependence augmented Dickey-Fuller (BCADF) regression and is called the BCIPS statistic. We initially develop the tests by assuming that the number of factors in the model is known and show that the limiting distribution of the BCADF statistic is free of nuisance parameters. The nonstandard limiting distribution of the (truncated) BCIPS statistic is also shown to exist and its critical values are tabulated. Monte-Carlo experiments point out that the sizes and powers of the BCIPS statistic are generally satisfactory as long as T is greater than or equal to fifty and a hundred, respectively. By using two different methods to determine the number of factors, both the BCIPS and CIPS tests are applied to examine the validity of long-run purchasing power parity. The proposed test complements the panel unit-root tests with breaks using dummy variables.","PeriodicalId":106740,"journal":{"name":"ERN: Other Econometrics: Econometric Model Construction","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ERN: Other Econometrics: Econometric Model Construction","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.2327962","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper proposes a new simple panel unit-root test by extending the cross-sectionally augmented panel unit-root test (CIPS) developed by Pesaran et al. (2013) to allow for smoothing structural changes in deterministic terms, approximated by a Fourier series. The proposed statistic is the simple average of the individual statistics constructed from the breaks and cross-sectional dependence augmented Dickey-Fuller (BCADF) regression and is called the BCIPS statistic. We initially develop the tests by assuming that the number of factors in the model is known and show that the limiting distribution of the BCADF statistic is free of nuisance parameters. The nonstandard limiting distribution of the (truncated) BCIPS statistic is also shown to exist and its critical values are tabulated. Monte-Carlo experiments point out that the sizes and powers of the BCIPS statistic are generally satisfactory as long as T is greater than or equal to fifty and a hundred, respectively. By using two different methods to determine the number of factors, both the BCIPS and CIPS tests are applied to examine the validity of long-run purchasing power parity. The proposed test complements the panel unit-root tests with breaks using dummy variables.