On path selection in combinational logic circuits

W. Li, S. Reddy, S. Sahni
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引用次数: 180

Abstract

The authors have developed a polynomial-time algorithm to find a minimum cardinality path set that can be used to verify the correct operation of a digital circuit. Although they have assumed that the circuit under consideration is a combinational logic circuit constructed from AND, OR, NAND, NOR, and NOT gates, circuits containing other types of gates can be accommodated by using an appropriate circuit model for such gates. The algorithms are also directly applicable to sequential circuits that use the so-called scan design, since in such circuits it is only necessary to test the combinational circuit embedded between latches.<>
组合逻辑电路中的路径选择
作者开发了一种多项式时间算法来寻找最小基数路径集,可用于验证数字电路的正确操作。虽然他们假设所考虑的电路是由AND, OR, NAND, NOR和NOT门构成的组合逻辑电路,但包含其他类型门的电路可以通过使用适当的电路模型来容纳这些门。这些算法也直接适用于使用所谓扫描设计的顺序电路,因为在这种电路中,只需要测试嵌入在锁存器之间的组合电路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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