Mechanical bending fatigue reliability and its application to area array packaging

A. Skipor, L. Leicht
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引用次数: 25

Abstract

The drive to finer pitch assemblies is in part due to smaller portable products. As these products reduce in size, the thickness of the printed circuit board must also reduce in thickness in proportion to the product size. These assemblies have become more flexible. Many of these products are assembled with area array packaging, which require numerous low-frequency mechanical deflections. The reliability emphasis has become more focused on isothermal bending fatigue. This paper will discuss a test method to evaluate bending fatigue reliability of 1.0 and 0.8 mm pitch area array packaging, the effect of printed circuit board (PCB) thickness, fatigue fracture morphology and its relation to solder joint location. Finite element results will also be presented to support and expand upon the findings in this study.
机械弯曲疲劳可靠性及其在面阵封装中的应用
更细间距组件的驱动部分是由于更小的便携式产品。随着这些产品尺寸的减小,印刷电路板的厚度也必须与产品尺寸成比例地减小。这些组件变得更加灵活。这些产品中的许多都是用区域阵列封装组装的,这需要大量的低频机械偏转。可靠性的重点越来越集中在等温弯曲疲劳上。本文将讨论一种评估1.0和0.8 mm间距面积阵列封装弯曲疲劳可靠性的测试方法,以及印刷电路板(PCB)厚度、疲劳断裂形貌及其与焊点位置的关系。有限元结果也将被提出来支持和扩展本研究的发现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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