{"title":"Partial discharges and light emission from ceramic substrates embedded in liquids and gels","authors":"V. Tho, J. Augé, O. Lesaint","doi":"10.1109/ICDL.2011.6015490","DOIUrl":null,"url":null,"abstract":"Aluminium nitrite (AlN) or alumina (Al2O3) substrates are widely used in power electronics modules, due to their ability to provide both electrical insulation, and heat conduction properties. A silicon gel usually covers the substrate, semiconductor chips, and bondings to prevent partial discharges (PD) from occurring within the module. However, at high voltage PDs can be observed in high electric field regions, mainly at the sharp edges of copper tracks on the substrate. In this study, we try to determine the origin of these PDs. Phase resolved PD recordings (PRPD) and optical visualization at very high sensitivity are carried out on substrates embedded in gel or insulating liquids. PD features are very different from those obtained in needle-plane geometry in gel or liquid, and do not depend on the nature of the liquid or gel. The main conclusion is that PDs recorded with substrates originate from the ceramic material itself, due to the presence of numerous μm-sized pores in sintered materials.","PeriodicalId":364451,"journal":{"name":"2011 IEEE International Conference on Dielectric Liquids","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on Dielectric Liquids","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICDL.2011.6015490","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Aluminium nitrite (AlN) or alumina (Al2O3) substrates are widely used in power electronics modules, due to their ability to provide both electrical insulation, and heat conduction properties. A silicon gel usually covers the substrate, semiconductor chips, and bondings to prevent partial discharges (PD) from occurring within the module. However, at high voltage PDs can be observed in high electric field regions, mainly at the sharp edges of copper tracks on the substrate. In this study, we try to determine the origin of these PDs. Phase resolved PD recordings (PRPD) and optical visualization at very high sensitivity are carried out on substrates embedded in gel or insulating liquids. PD features are very different from those obtained in needle-plane geometry in gel or liquid, and do not depend on the nature of the liquid or gel. The main conclusion is that PDs recorded with substrates originate from the ceramic material itself, due to the presence of numerous μm-sized pores in sintered materials.