IEEE Standard Boundary Scan 1149.1 An Introduction

Abstract

With increased system packaging density, testability advantages of scan design were applied to IC boundary pins for ensured pin access where direct physical contact was becoming increasingly difficult. As the advantages of boundary-scan were becoming recognized in many commercial applications, it became apparent that a universal definition was needed to achieve the economies of using an industry standard. This led to the 1990 approval of IEEE Standard 1149. 1.