Wafer bonding technique based GaN/Quantum Dots/GaN system

Ying Li, E. Stokes
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Abstract

Integration of colloidal semiconductor quantum dots with epitaxial semiconductor materials offers the possibility of a wide variety of new device structures. In this work, wafer bonding processes for layered GaN/Quantum Dots/GaN structures are described. Bonding is achieved by thermal reorganization of bidentate ligand thiophenethiol which initially caps the CdSe/ZnS core/shell quantum dots. Annealing temperature dependent bond strength feature is characterized. Maximum bond strength is achieved after annealing at 350°C. Effect of annealing on quantum dot photoluminescence is also investigated.
基于GaN/量子点/GaN系统的晶圆键合技术
胶体半导体量子点与外延半导体材料的集成提供了多种新器件结构的可能性。在这项工作中,描述了层状GaN/量子点/GaN结构的晶圆键合过程。键合是通过双齿配体硫代噻吩硫醇的热重组实现的,硫代噻吩硫醇最初覆盖CdSe/ZnS核壳量子点。表征了与退火温度相关的粘结强度特征。在350°C退火后达到最大粘结强度。研究了退火对量子点光致发光的影响。
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