Ho-Young Lee, Tae-Hwan Oh, Hojin Park, Hae-Seung Lee, M. Spaeth, Jae-Whui Kim
{"title":"A 14-b 30MS/s 0.75mm2 Pipelined ADC with On-Chip Digital Self-Calibration","authors":"Ho-Young Lee, Tae-Hwan Oh, Hojin Park, Hae-Seung Lee, M. Spaeth, Jae-Whui Kim","doi":"10.1109/CICC.2007.4405741","DOIUrl":null,"url":null,"abstract":"A 14-b 30 MS/s CMOS pipelined ADC is presented. To facilitate digital calibration, a simple 1-b per stage architecture with redundancy is used. The ADC fully integrates digital self-calibration, which performs overall sequence by one flag signal. Implemented in a 90 nm digital CMOS process, the prototype ADC achieves 83.7 dB SFDR and 69.3 dB SNDR with calibration. Its active area is 0.75 mm2 including the on-chip calibration logic and the total power consumes 106 mW with 3.3 V and 1.0 V supply.","PeriodicalId":130106,"journal":{"name":"2007 IEEE Custom Integrated Circuits Conference","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2007.4405741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
A 14-b 30 MS/s CMOS pipelined ADC is presented. To facilitate digital calibration, a simple 1-b per stage architecture with redundancy is used. The ADC fully integrates digital self-calibration, which performs overall sequence by one flag signal. Implemented in a 90 nm digital CMOS process, the prototype ADC achieves 83.7 dB SFDR and 69.3 dB SNDR with calibration. Its active area is 0.75 mm2 including the on-chip calibration logic and the total power consumes 106 mW with 3.3 V and 1.0 V supply.