Field Emission Model with Diminishing Thickness from Bulk to 2D materials

W. J. Chan, Y. Ang, L. Ang
{"title":"Field Emission Model with Diminishing Thickness from Bulk to 2D materials","authors":"W. J. Chan, Y. Ang, L. Ang","doi":"10.1109/ICOPS45751.2022.9813353","DOIUrl":null,"url":null,"abstract":"Two-dimensional (2D) materials-based field emitters, such as graphene and 2D topological materials, have attracted enormous attention due to their excellent field emission properties and performance. However, the modelling of the out-of-plane electron emission still poses a serious physics challenge. The lack of crystal periodicity and the confinement of electrons within the 2D material atomic plane have challenged the conventional physical picture of field emission from 3D metals developed in the past century. To resolve this problem for field emission, a quasi-2D model two-barrier model has been developed to study the behaviour of field emission when the material geometry is continuously shrunken from 3D bulk emitters to 2D emitters using a phenomenological quantum well method. The predicted findings agree well with the respective limits of large and thin materials, corresponding to the field emission by 3D (or bulk) and 2D materials, respectively. The model provides a comprehensive understanding of the field emission for finite layers of 2D materials in addition to the well-studied 2D thermionic electron emission. These recent works have suggested that the classical scaling laws developed decades ago for field and thermal-field emission may not be valid in the 2D flatland.","PeriodicalId":175964,"journal":{"name":"2022 IEEE International Conference on Plasma Science (ICOPS)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Plasma Science (ICOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICOPS45751.2022.9813353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Two-dimensional (2D) materials-based field emitters, such as graphene and 2D topological materials, have attracted enormous attention due to their excellent field emission properties and performance. However, the modelling of the out-of-plane electron emission still poses a serious physics challenge. The lack of crystal periodicity and the confinement of electrons within the 2D material atomic plane have challenged the conventional physical picture of field emission from 3D metals developed in the past century. To resolve this problem for field emission, a quasi-2D model two-barrier model has been developed to study the behaviour of field emission when the material geometry is continuously shrunken from 3D bulk emitters to 2D emitters using a phenomenological quantum well method. The predicted findings agree well with the respective limits of large and thin materials, corresponding to the field emission by 3D (or bulk) and 2D materials, respectively. The model provides a comprehensive understanding of the field emission for finite layers of 2D materials in addition to the well-studied 2D thermionic electron emission. These recent works have suggested that the classical scaling laws developed decades ago for field and thermal-field emission may not be valid in the 2D flatland.
从块状到二维材料厚度递减的场发射模型
基于二维(2D)材料的场发射材料,如石墨烯和二维拓扑材料,由于其优异的场发射特性和性能而受到广泛关注。然而,面外电子发射的建模仍然是一个严峻的物理挑战。晶体周期性的缺乏和电子在二维材料原子平面内的限制对过去一个世纪开发的三维金属场发射的传统物理图像提出了挑战。为了解决场发射的这一问题,本文建立了准二维模型双势垒模型,利用现象学量子阱方法研究了材料几何形状从三维体发射体不断缩小到二维发射体时的场发射行为。预测结果很好地符合大材料和薄材料各自的极限,分别对应于3D(或块状)和2D材料的场发射。该模型提供了对有限层二维材料场发射的全面理解,以及对二维热离子电子发射的深入研究。这些最近的工作表明,几十年前发展起来的场和热场发射的经典标度定律可能不适用于二维平面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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