{"title":"Design and Application of an IC Chip Test Instrument Based on HT46RU24","authors":"Baosen Xiao, Xiao-long Li, Yuhui Lin, Yao Zhang","doi":"10.1109/ISCTIS51085.2021.00056","DOIUrl":null,"url":null,"abstract":"According to the principle of digital system test and testability, with the HT46RU24 microcontroller as the core, a fixed fault model is established. This instrument can complete the test of TTL series and CMOS series digital integrated circuit chips within 20 pins.","PeriodicalId":403102,"journal":{"name":"2021 International Symposium on Computer Technology and Information Science (ISCTIS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Symposium on Computer Technology and Information Science (ISCTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCTIS51085.2021.00056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
According to the principle of digital system test and testability, with the HT46RU24 microcontroller as the core, a fixed fault model is established. This instrument can complete the test of TTL series and CMOS series digital integrated circuit chips within 20 pins.