Experimental results illustrating performance limitations and design tradeoffs in probe-fed microstrip-patch element phased arrays

J. Hanfling
{"title":"Experimental results illustrating performance limitations and design tradeoffs in probe-fed microstrip-patch element phased arrays","authors":"J. Hanfling","doi":"10.1109/APS.1986.1149789","DOIUrl":null,"url":null,"abstract":"w i th cu r ren t t heo ry . The performance parameters t h a t were i n volved included element act ive impedance as a func t ion o f scan angle and frequency and corresponding coand c ross-po la r ized embedded element patterns. The performance trends and l i m i t a t ions eventual ly impact the dec is ions on the des ign conf igura t ion such as s ing le or dual probes, subst rate mater ia l , patch height and dimensions, l a t t i c e spacing, and probe feed and matching network.","PeriodicalId":399329,"journal":{"name":"1986 Antennas and Propagation Society International Symposium","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 Antennas and Propagation Society International Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APS.1986.1149789","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

w i th cu r ren t t heo ry . The performance parameters t h a t were i n volved included element act ive impedance as a func t ion o f scan angle and frequency and corresponding coand c ross-po la r ized embedded element patterns. The performance trends and l i m i t a t ions eventual ly impact the dec is ions on the des ign conf igura t ion such as s ing le or dual probes, subst rate mater ia l , patch height and dimensions, l a t t i c e spacing, and probe feed and matching network.
实验结果说明了探针馈电微带贴片元件相控阵的性能限制和设计权衡
我想我的朋友们都很高兴。所涉及的性能参数包括元件的有源阻抗与扫描角和频率的函数关系以及相应的协同和交叉排列的嵌入元件模式。性能趋势和测试结果最终会影响设计配置的决策,如单探头或双探头、基材率、贴片高度和尺寸、贴片间距、探针馈送和匹配网络等。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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