Processor reliability enhancement through compiler-directed register file peak temperature reduction

Chengmo Yang, A. Orailoglu
{"title":"Processor reliability enhancement through compiler-directed register file peak temperature reduction","authors":"Chengmo Yang, A. Orailoglu","doi":"10.1109/DSN.2009.5270305","DOIUrl":null,"url":null,"abstract":"Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliability. Temperature hotspots not only accelerate the physical failure mechanisms such as electromigration and dielectric breakdown, but furthermore make the system more vulnerable to timing-related intermittent failures. Traditional thermal management techniques suffer from considerable performance overhead as the entire processor needs to be stalled or slowed down to preclude heat accumulation. Given the significant temporal and spatial variations of the chip-wide temperature, we propose in this paper a technique that directly targets one of the resources that is most likely to overheat in current processors, namely, the register files. Instead of duplicating or physically distributing the register file, we suggest to attain power density control through exploiting the extant spatial slack associated with register file accesses. Based on application-specific access profiles, a compiler-directed register shuffling strategy is proposed to deterministically construct the logical to physical register mapping in a rotating manner. Simulation results confirm that the proposed technique attains, within a limited hardware budget and negligible performance degradation, effective reduction in peak temperature and hence in the expected fault rates for the entire chip.","PeriodicalId":376982,"journal":{"name":"2009 IEEE/IFIP International Conference on Dependable Systems & Networks","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE/IFIP International Conference on Dependable Systems & Networks","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2009.5270305","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

Abstract

Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliability. Temperature hotspots not only accelerate the physical failure mechanisms such as electromigration and dielectric breakdown, but furthermore make the system more vulnerable to timing-related intermittent failures. Traditional thermal management techniques suffer from considerable performance overhead as the entire processor needs to be stalled or slowed down to preclude heat accumulation. Given the significant temporal and spatial variations of the chip-wide temperature, we propose in this paper a technique that directly targets one of the resources that is most likely to overheat in current processors, namely, the register files. Instead of duplicating or physically distributing the register file, we suggest to attain power density control through exploiting the extant spatial slack associated with register file accesses. Based on application-specific access profiles, a compiler-directed register shuffling strategy is proposed to deterministically construct the logical to physical register mapping in a rotating manner. Simulation results confirm that the proposed technique attains, within a limited hardware budget and negligible performance degradation, effective reduction in peak temperature and hence in the expected fault rates for the entire chip.
通过编译器定向寄存器文件峰值温度降低处理器可靠性增强
每一代半导体技术都使我们更接近即将到来的处理器架构热墙,以及其对系统性能和可靠性的所有相关不利影响。温度热点不仅加速了电迁移和介质击穿等物理失效机制,而且使系统更容易发生与时间相关的间歇性失效。传统的热管理技术存在相当大的性能开销,因为整个处理器需要停止或减速以防止热量积聚。考虑到芯片范围内温度的显著时空变化,我们在本文中提出了一种直接针对当前处理器中最有可能过热的资源之一的技术,即寄存器文件。我们建议通过利用与寄存器文件访问相关的现有空间松弛来实现功率密度控制,而不是复制或物理分布寄存器文件。基于特定应用程序的访问配置文件,提出了一种编译器导向的寄存器变换策略,以旋转的方式确定地构建逻辑寄存器到物理寄存器的映射。仿真结果证实,所提出的技术在有限的硬件预算和可忽略不计的性能下降的情况下,有效地降低了峰值温度,从而降低了整个芯片的预期故障率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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