{"title":"FIMA: Fault Intensity Map Analysis","authors":"Keyvan Ramezanpour, P. Ampadu, William Diehl","doi":"10.1007/978-3-030-16350-1_5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":413748,"journal":{"name":"International Workshop on Constructive Side-Channel Analysis and Secure Design","volume":"158 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Workshop on Constructive Side-Channel Analysis and Secure Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-16350-1_5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}