Utilizing high level design information to speed up post-silicon debugging

M. Fujita
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Abstract

Due to the highly complicated control structures of modern processors as well as ASICs, some of the logical bugs may easily escape from the pre-silicon verification processes and remain into the silicon. Those bugs can only be found after the chip has been fabricated and used in the systems. So post-silicon debugging is becoming a essential part of the design flows for complicated and large system designs. This paper summarizes our research activities targeting post-silicon debugging for highly complicated pipeline processors as well as large ASICs. We have been working on the following three topics: 1) Translation of chip level error traces to high and abstracted level so that more efficient simulation as well as formal analysis become possible, 2) Utilize experiences on formal verification and debugging processes for pipelined processors for debugging and in-fields rectification of chips, and 3) Apply incremental high level synthesis for efficient in-fields rectifications of ASIC designs. Our approaches utilize high level or abstracted design information as much as possible to make things more efficient and effective. In this paper we briefly present the techniques for the first two topics.
利用高层次的设计信息,以加快后硅调试
由于现代处理器和asic的控制结构非常复杂,一些逻辑错误很容易从预硅验证过程中逃脱并留在硅中。这些漏洞只有在芯片被制造出来并在系统中使用后才能被发现。因此,硅后调试已成为复杂大型系统设计流程的重要组成部分。本文总结了我们针对高度复杂的流水线处理器和大型asic的后硅调试的研究活动。我们一直致力于以下三个主题:1)将芯片级错误跟踪转换为高级和抽象级别,以便更有效的模拟和形式化分析成为可能;2)利用流水线处理器的形式化验证和调试过程的经验进行芯片的调试和现场整流;3)应用增量高级综合进行ASIC设计的有效现场整流。我们的方法尽可能多地利用高层次或抽象的设计信息,使事情变得更加高效和有效。在本文中,我们简要介绍了前两个主题的技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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