A non-volatile run-time FPGA using thermally assisted switching MRAMS

Yoann Guillemenet, L. Torres, G. Sassatelli, N. Bruchon, Ilham Hassoune
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引用次数: 39

Abstract

This paper describes the integration of a thermally assisted switching magnetic random access memory (TAS-MRAM) in FPGA design. The non-volatility of the latter is achieved through the use of magnetic tunneling junctions (MTJ) in the MRAM cell. A thermally assisted switching scheme is used to write data in the MTJ device, which helps to reduce power consumption during write operation in comparison to the writing scheme in classical MTJ device. Plus, the non-volatility of such a design should reduce both power consumption and configuration time required at each power up of the circuit in comparison to classical SRAM based FPGAs. A real time reconfigurable (RTR) micro-FPGA using TAS-MRAM allows dynamic reconfiguration mechanisms, while featuring simple design architecture.
使用热辅助开关MRAMS的非易失性运行时FPGA
本文介绍了热辅助开关磁随机存取存储器(TAS-MRAM)在FPGA中的集成设计。后者的非挥发性是通过在MRAM单元中使用磁性隧道结(MTJ)来实现的。在MTJ器件中采用热辅助开关方式进行数据写入,与传统MTJ器件的写入方式相比,降低了写入过程中的功耗。此外,与经典的基于SRAM的fpga相比,这种设计的非易失性应该降低电路每次上电时所需的功耗和配置时间。使用TAS-MRAM的实时可重构(RTR)微fpga允许动态重构机制,同时具有简单的设计架构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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