Reliability Perspective on the IoT and Nanoelectronics

Abstract

Internet of Things (IoT) is coming strongly and we have no escape to it. While current technology and its development can indeed make IoT a reality, its cost has to be much lower and at the same time its reliability must be very high. Furthermore, the necessity of nano-electronics in IoT presents new degradation mechanisms that need to be studied in detail. Thus, it is a huge challenge in reliability field in anticipation of IoT era. This work presents some critical issues and highlight some works that are being done to meet the coming challenges.