Texture defect detection using subband domain co-occurrence matrices

Abstract

In this paper, a new defect detection algorithm for textured images is presented. The algorithm is based on the subband decomposition of gray level images through wavelet filters and extraction of the co-occurrence features from the subband images. Detection of defects within the inspected texture is performed by partitioning the textured image into non-overlapping subwindows and classifying each subwindow as defective or nondefective with a mahalanobis distance classifier being trained on defect free samples a priori. The experimental results demonstrating the use of this algorithm for the visual inspection of textile products obtained from the real factory environment are also presented.