Cheng-tao Li, Che-Yu Liu, S. Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su
{"title":"Time domain Near-Field Measurement Technology and Simulation for System Level ESD Testing","authors":"Cheng-tao Li, Che-Yu Liu, S. Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su","doi":"10.1109/iWEM49354.2020.9237414","DOIUrl":null,"url":null,"abstract":"In this paper, time domain near field measurement for system level ESD (electrostatic discharge) is to solve temporary failures in ESD testing. First, this paper measure the waveform of ESD by oscilloscope then use simulation tools to create the model of ESD gun and nearfield simulation result. Finally, we use time domain near field measurement system to measure the sample and compare with simulation result.","PeriodicalId":201518,"journal":{"name":"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iWEM49354.2020.9237414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, time domain near field measurement for system level ESD (electrostatic discharge) is to solve temporary failures in ESD testing. First, this paper measure the waveform of ESD by oscilloscope then use simulation tools to create the model of ESD gun and nearfield simulation result. Finally, we use time domain near field measurement system to measure the sample and compare with simulation result.