Diamond-Like Silicon-Carbon Films Preparation at Different Frequencies of Plasma-Chemical Decomposition

T. Chukanova, A. Barinov, V. Yemets, D.A. Zezin, A. Popov
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Abstract

In this paper, a reactor is created for the preparation of amorphous diamond-like silicon-carbon films by the plasma enhanced chemical vapor deposition method at electric field frequencies from 100 kHz to 2 MHz and substrate-holder bias voltages from 100 to 2000 V. Silicon-carbon films is prepared in this electric field frequency range and a study was carried out their chemical composition, surface morphology, electrical and mechanical properties. The existing results are shown that the variation of the electric field frequency during the plasma-chemical decomposition of the precursor is an effective method for controlling the properties of silicon-carbon films at a constant chemical and phase composition of the material. The frequency ranges of the electric field are determined, which provide the maximum and minimum changes in the properties of the prepared films.
等离子体化学分解不同频率下类金刚石硅碳膜的制备
本文采用等离子体增强化学气相沉积法,在100 kHz ~ 2 MHz的电场频率和100 ~ 2000 V的衬底偏压条件下制备了非晶类金刚石硅碳薄膜。在此电场频率范围内制备了硅碳薄膜,并对其化学成分、表面形貌、电学性能和力学性能进行了研究。现有的研究结果表明,前驱体等离子体化学分解过程中电场频率的变化是在材料化学组成和物相组成不变的情况下控制硅碳薄膜性能的有效方法。确定了电场的频率范围,该范围提供了所制备薄膜性能的最大和最小变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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