Incoming Inspection of FPGAs

Abstract

The article describes various approaches to the functional tests used by the independent test laboratories for incoming inspection of FPGAs used in the aerospace industry. Proposed solution is based on the various approaches to the functional test, such as methods Iterative Logic Arrays (ILA) used together with automated test equipment (ATE) for testing internal programmable logic of the FPGA, as well as the Built-in Self- Test BIST approaches used for testing embedded FPGA cores. Described functional tests are used for confirmation that FPGAs are fault-free and can be used in the developed equipment.