Q-band computerized slotted line system

T. An, J. Mao, Q. Meng, H. Yan, J. Fang
{"title":"Q-band computerized slotted line system","authors":"T. An, J. Mao, Q. Meng, H. Yan, J. Fang","doi":"10.1109/MWSYM.1988.22141","DOIUrl":null,"url":null,"abstract":"An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988., IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1988.22141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<>
q波段计算机化槽线系统
研制了一套q波段网络参数自动测试系统。该系统基于传统的槽线系统,由Apple II微型计算机控制。介绍了该系统的原理、结构和特点。给出了复反射系数、电压驻波比、阻抗、衰减和s参数的典型结果。该系统有望在开发短毫米波频段测试系统中发挥重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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