{"title":"Temperature-adaptive dynamic voltage scaling for high temperature energy efficiency in subthreshold memory banks","authors":"R. Kumar, V. Kursun","doi":"10.1109/MWSCAS.2008.4616861","DOIUrl":null,"url":null,"abstract":"Static random access memory (SRAM) circuits optimized for minimum energy consumption typically operate in the subthreshold regime with ultra-low power-supply-voltages. Both the read and the write propagation delays of a subthreshold memory circuit are significantly reduced with an increase in the die temperature. The excessive timing slack observed in the clock period of constant-frequency subthreshold memory circuits at elevated temperatures provides new opportunities to lower the active mode energy consumption. Temperature-adaptive dynamic supply voltage tuning technique is proposed in this paper to reduce the high temperature energy consumption of ultra-low-voltage subthreshold SRAM arrays. Results with a 64-bit times 64-bit memory array in the TSMC 180 nm CMOS technology indicate that the energy consumption can be lowered by up to 32.8% by dynamically scaling the supply voltage at elevated temperatures.","PeriodicalId":118637,"journal":{"name":"2008 51st Midwest Symposium on Circuits and Systems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 51st Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2008.4616861","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Static random access memory (SRAM) circuits optimized for minimum energy consumption typically operate in the subthreshold regime with ultra-low power-supply-voltages. Both the read and the write propagation delays of a subthreshold memory circuit are significantly reduced with an increase in the die temperature. The excessive timing slack observed in the clock period of constant-frequency subthreshold memory circuits at elevated temperatures provides new opportunities to lower the active mode energy consumption. Temperature-adaptive dynamic supply voltage tuning technique is proposed in this paper to reduce the high temperature energy consumption of ultra-low-voltage subthreshold SRAM arrays. Results with a 64-bit times 64-bit memory array in the TSMC 180 nm CMOS technology indicate that the energy consumption can be lowered by up to 32.8% by dynamically scaling the supply voltage at elevated temperatures.