Temperature-adaptive dynamic voltage scaling for high temperature energy efficiency in subthreshold memory banks

R. Kumar, V. Kursun
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Abstract

Static random access memory (SRAM) circuits optimized for minimum energy consumption typically operate in the subthreshold regime with ultra-low power-supply-voltages. Both the read and the write propagation delays of a subthreshold memory circuit are significantly reduced with an increase in the die temperature. The excessive timing slack observed in the clock period of constant-frequency subthreshold memory circuits at elevated temperatures provides new opportunities to lower the active mode energy consumption. Temperature-adaptive dynamic supply voltage tuning technique is proposed in this paper to reduce the high temperature energy consumption of ultra-low-voltage subthreshold SRAM arrays. Results with a 64-bit times 64-bit memory array in the TSMC 180 nm CMOS technology indicate that the energy consumption can be lowered by up to 32.8% by dynamically scaling the supply voltage at elevated temperatures.
基于温度自适应动态电压标度的亚阈值存储组高温能效研究
静态随机存取存储器(SRAM)电路为实现最小能耗而优化,通常工作在超低电源电压的亚阈值状态下。随着芯片温度的升高,亚阈值存储电路的读和写传播延迟都显著降低。在高温下恒频亚阈值存储电路的时钟周期中观察到的过多的时序松弛为降低有源模式的能量消耗提供了新的机会。为了降低超低电压亚阈值SRAM阵列的高温能耗,提出了一种温度自适应动态电源电压调谐技术。采用台积电180 nm CMOS技术的64位× 64位存储器阵列的研究结果表明,在高温下动态缩放电源电压可将能耗降低32.8%。
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