Design and Implementation of Crosstalk Noise Avoidance by using Advanced Test Adapted Shielding for high speed vlsi circuits

B. Obulesu, K. V. Raju, P. S. Sumanth, A. Vamsi, C. Kiran
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Abstract

The Crosstalk noise is existing in VLSI circuits because of the electromagnetic coupling in between the wires unfriendly, it affects the VLSI circuits accurate performance. This makes interconnect testing a vital issue in responsibility analysis that causes additional space and hardware operating overhead[2]. In this project, we have a tendency to gift a completely unique methodology that we have a tendency to talk over with advanced Test Adaptive Shielding (TAS), so as to boost testing challenges and in addition to optimize crosstalk noise. Boosting of circuit performance is done by test structure at Test adapted shielding which includes the insertion of modified shield lines. The Hardware which is being developed for test data is sensible to ignore the aggregation faced by victim lines due to crosstalk noise. The main methodology of TAS method is to reduce he over use of power, complex nature, fault detection. The projected technique will implement in ASIC, VERILOG HDL.
高速vlsi电路中基于先进测试适应屏蔽的串扰噪声避免设计与实现
超大规模集成电路中由于导线之间的电磁耦合不友好而存在串扰噪声,影响了超大规模集成电路的精确性能。这使得互连测试成为责任分析中的一个重要问题,它会导致额外的空间和硬件操作开销[2]。在这个项目中,我们倾向于提供一种完全独特的方法,我们倾向于讨论先进的测试自适应屏蔽(TAS),以提高测试挑战,并优化串扰噪声。电路性能的提高是通过测试适应屏蔽的测试结构来完成的,其中包括插入修改的屏蔽线。为测试数据而开发的硬件可以忽略由于串扰噪声而导致的受害线所面临的聚合。TAS方法的主要方法论是减少功率的过度使用,性质复杂,故障检测。该技术将在ASIC, VERILOG HDL中实现。
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