New measurement method for two-port noise parameters

Abstract

The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input as in Eq. 1. F= FMIN + RN over ∜ YS|YS − YOPT|² (1) where YS is the admittance presented at the input and YOPT is the admittance for which the noise figure has its lower value FMIN. RN is the noise resistance that characterizes the sensitivity to the variation of the impedance. Many optimization methods [1] have been developed in order to reach FMIN, RN and YOPT from many measurement points.