{"title":"Fault Tolerance in FPGA Architecture Using Hardware Controller - A Design Approach","authors":"M. Naseer, Prashant Sharma, R. Kshirsagar","doi":"10.1109/ARTCom.2009.236","DOIUrl":null,"url":null,"abstract":"With advancement in process technology, the feature size is decreasing which leads to higher defect densities. More sophisticated techniques at increased costs are required to avoid defects. If nano-technology fabrication are applied the yield may go down to zero as avoiding defect during fabrication will not be a feasible option Hence, feature architecture have to be defect tolerant. In regular structure like FPGA, redundancy is commonly used for fault tolerance. In this work we present a solution in which configuration bit-stream of FPGA is modified by a hardware controller that is present on the chip itself. The technique uses redundant device for replacing faulty device and increases the yield. The design is implemented using FPGA Altera Quartus II EC121Q240C6.","PeriodicalId":256610,"journal":{"name":"2009 International Conference on Advances in Recent Technologies in Communication and Computing","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Advances in Recent Technologies in Communication and Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARTCom.2009.236","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
With advancement in process technology, the feature size is decreasing which leads to higher defect densities. More sophisticated techniques at increased costs are required to avoid defects. If nano-technology fabrication are applied the yield may go down to zero as avoiding defect during fabrication will not be a feasible option Hence, feature architecture have to be defect tolerant. In regular structure like FPGA, redundancy is commonly used for fault tolerance. In this work we present a solution in which configuration bit-stream of FPGA is modified by a hardware controller that is present on the chip itself. The technique uses redundant device for replacing faulty device and increases the yield. The design is implemented using FPGA Altera Quartus II EC121Q240C6.
随着工艺技术的进步,特征尺寸越来越小,导致缺陷密度越来越高。为了避免缺陷,需要更复杂的技术和更高的成本。如果应用纳米技术制造,由于在制造过程中无法避免缺陷,良率可能会降至零,因此,特征架构必须具有缺陷容忍度。在像FPGA这样的常规结构中,冗余通常用于容错。在这项工作中,我们提出了一种解决方案,其中FPGA的配置位流由存在于芯片本身的硬件控制器修改。该技术采用冗余装置代替故障装置,提高了成品率。本设计采用Altera Quartus II EC121Q240C6 FPGA实现。