{"title":"Two-Port Verification Standards in 3.5mm and 7mm for Vector Automatic Network Analyzers","authors":"M. Maury, G. Simpson","doi":"10.1109/ARFTG.1984.323584","DOIUrl":null,"url":null,"abstract":"Verification standards are required to determine the accuracy of Vector Automatic Network Analyzer (VANA) measurements. This paper deals with \"two-port\" verification standards which are basically beadless air dielectric transmission lines which can be made to provide a wide range of accurately known S-parameters. Standards in 3.5mm and 7mm configurations will be discussed as well as the criticalness of the test port on standards of this type. Construction details, calibration techniques and measurement results are presented. Also covered wi11 be recommendations for verification kits, their configuration and implementation in an in-house metrology program.","PeriodicalId":137724,"journal":{"name":"23rd ARFTG Conference Digest","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1984.323584","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Verification standards are required to determine the accuracy of Vector Automatic Network Analyzer (VANA) measurements. This paper deals with "two-port" verification standards which are basically beadless air dielectric transmission lines which can be made to provide a wide range of accurately known S-parameters. Standards in 3.5mm and 7mm configurations will be discussed as well as the criticalness of the test port on standards of this type. Construction details, calibration techniques and measurement results are presented. Also covered wi11 be recommendations for verification kits, their configuration and implementation in an in-house metrology program.