Study the effect of nanoic indium oxide (In2O3) on electrical properties of ZnO- based varistor

M. Abbas, A. Ibraheem
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Abstract

In this present work, we studied the influence of nanoic (In2O3) Doping of ZnO varistors’ electrical characteristics, I-V nonlinear coefficient, the leakage current, break down voltage and grain size, have been studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), electrical measurements, with different sintering temperatures (1000, 1050, 1100) °C for 2h. The results exhibit the nonlinear coefficient (α) gradually increased by increasing concentrations of (In2O3), Sintered varistor leakage current reduced with increased dopant concentration of nanoic (In2O3), the breakdown voltage values reduced with increased the sintering temperature. With the increasing (In2O3), The average grain size slightly reduced, which are improving the voltage gradient.In this present work, we studied the influence of nanoic (In2O3) Doping of ZnO varistors’ electrical characteristics, I-V nonlinear coefficient, the leakage current, break down voltage and grain size, have been studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), electrical measurements, with different sintering temperatures (1000, 1050, 1100) °C for 2h. The results exhibit the nonlinear coefficient (α) gradually increased by increasing concentrations of (In2O3), Sintered varistor leakage current reduced with increased dopant concentration of nanoic (In2O3), the breakdown voltage values reduced with increased the sintering temperature. With the increasing (In2O3), The average grain size slightly reduced, which are improving the voltage gradient.
研究了纳米氧化铟(In2O3)对ZnO基压敏电阻电性能的影响
本文研究了纳米(In2O3)掺杂对ZnO压敏电阻电学特性、I-V非线性系数、漏电流、击穿电压和晶粒尺寸的影响,采用x射线衍射(XRD)、扫描电镜(SEM)、电学测量等方法,在不同烧结温度(1000、1050、1100)℃下烧结2h进行了研究。结果表明:随着(In2O3)浓度的增加,非线性系数(α)逐渐增大,烧结压敏电阻泄漏电流随着掺杂纳米(In2O3)浓度的增加而减小,击穿电压值随着烧结温度的升高而减小。随着(In2O3)含量的增加,平均晶粒尺寸略有减小,这都改善了电压梯度。本文研究了纳米(In2O3)掺杂对ZnO压敏电阻电学特性、I-V非线性系数、漏电流、击穿电压和晶粒尺寸的影响,采用x射线衍射(XRD)、扫描电镜(SEM)、电学测量等方法,在不同烧结温度(1000、1050、1100)℃下烧结2h进行了研究。结果表明:随着(In2O3)浓度的增加,非线性系数(α)逐渐增大,烧结压敏电阻泄漏电流随着掺杂纳米(In2O3)浓度的增加而减小,击穿电压值随着烧结温度的升高而减小。随着(In2O3)含量的增加,平均晶粒尺寸略有减小,这都改善了电压梯度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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