{"title":"GP-GPU based high-performance test equipment for debugging radar digital units","authors":"R. Badarinath, M. Abhilash","doi":"10.1109/SAPIENCE.2016.7684173","DOIUrl":null,"url":null,"abstract":"Modern active phased array radars are made to optimize the size, weight and power without compromising its capability to combat with advanced electronic warfare. To accomplish this task, the signal is digitized at element level or at sub-array level and processed with the help of advanced digital signal processor. Proving the capabilities of this firmware at bench level helps to reduce the overall development time. Hence, it is necessary to have a built-in test unit or test vector generator to verify the optimal performance of digital modules. The best way to accomplish this goal is to use a high speed baseband I & Q radar data generator which helps in testing, identifying and segregating the problems at various stages. In this paper we have explored the capability of latest general purpose graphical processing unit (GP-GPU) as software defined built in test vector generator with high throughput for active array radar applications.","PeriodicalId":340137,"journal":{"name":"2016 International Conference on Data Mining and Advanced Computing (SAPIENCE)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Data Mining and Advanced Computing (SAPIENCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAPIENCE.2016.7684173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Modern active phased array radars are made to optimize the size, weight and power without compromising its capability to combat with advanced electronic warfare. To accomplish this task, the signal is digitized at element level or at sub-array level and processed with the help of advanced digital signal processor. Proving the capabilities of this firmware at bench level helps to reduce the overall development time. Hence, it is necessary to have a built-in test unit or test vector generator to verify the optimal performance of digital modules. The best way to accomplish this goal is to use a high speed baseband I & Q radar data generator which helps in testing, identifying and segregating the problems at various stages. In this paper we have explored the capability of latest general purpose graphical processing unit (GP-GPU) as software defined built in test vector generator with high throughput for active array radar applications.